Low Cost CMOS On-Chip and Remote Temperature Sensors

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概要

• 論文の詳細を見る

• This paper describes the design and results of low cost integrated CMOS local and remote temperature sensors with digital outputs. No trimming is needed to obtain good temperature linearity, so that only one-temperature calibration is needed which greatly reduces testing cost. The base-emitter voltage of the parasitic substrate bipolar transistor is used to measure the local temperature. A diode-connected external bipolar transistor is used to measure the remote temperature. Chopper techniques were used to cancel the offset voltage of the op-amp, so that a precise bandgap voltage can be obtained without resistance trimming. A first order ΣΔ ADC was used to produce the digital output. The local and remote temperature sensors were realized in a 0.6μm single-poly triple-metal CMOS technology with active area of 0.6mm^2 and 0.65mm^2, respectively. After calibration, the error is ±1℃ for the local temperature sensor over the temperature range of -20 to 130℃, and ±2℃ for the remote temperature sensor over the range of 0 to 120℃. The supply currents of the local and remote temperature sensors are 3.5μA and 38μA at 8 samples/s, respectively.

• 社団法人電子情報通信学会の論文
• 2001-04-01

著者

• Wu Jiin-chuan

  The Integrated Circuit And Systems Laboratory Department Of Electronics Engineering National Chiao-t

• Weng M‐c

  National Chiao‐tung Univ. Hsinchu Twn

• WENG Ming-Chan

  the Integrated Circuit and Systems Laboratory, Department of Electronics Engineering, National Chiao

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