Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface

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概要

• 論文の詳細を見る

• Surface damage of the electrical contact is a primary cause of failure in many electronic devices which use sliding contacts. Therefore, the quantitative observation of the contact surface is one of the most important subjects for improvement of contact reliability. In this study, in order to clarify the relationship between the contact resistance and the damage on the contact surface, a digital image measuring system (DIMS) was developed. A shadow image processig technique (SIPT) was applied to the damage analysis on the sliding contact surface. The damage width on the contact surface and the damaged image could be obtained with a 3-D graphic image by applying both DIMS and SIPT. Part of the relationship between the damage on the contact surface and the contact resistance could be obtained in the case when Cu is used for the moving contact and Cu and Ni are used for the static contact.

• 社団法人電子情報通信学会の論文
• 1998-03-25

著者

• Kanazawa Miyataka

  The Course Of Electrical Engineering Graduate Of Meijo University

• TANIGUCHI Masanari

  the Faculty of Science and Technology, Meijo University

• TAKAGI Tasuku

  the Engineering College, Nihon University

• Taniguchi M

  The Faculty Of Science And Technology Meijo University

• Taniguchi Masanari

  The Faculty Of Science And Technology Meijo University

• Takagi Tasuku

  The Engineering College Nihon University

関連論文

• Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface
• Holographic Pattern Measurement of Printed Circuit Board (PCB) Vibration due to Mounted Electromagnetic Relay Operation (Special Section of Letters Selected from the 1993 IEICE Spring Conference)

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