Efficient Characterization of Complex H-Plane Waveguide π-Junction and Cross-Junctions
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概要
- 論文の詳細を見る
An efficient full-wave approach for the accurate characterization of a H-plane waveguide π-junction with an inductive post and a waveguide cross-junction is proposed. By employing the port reflection coefficient method (PRCM), the analysis and solution procedures of these complex waveguide junctions are greatly simplified and only the calculation of field reflections caused by the simplest waveguide step-junction discontinuities are required. The reflections are easily determined by the mode-matching technique. Scattering parameters of these junctions are provided and discussed in terms of the working frequency and the geometrical dimensions of the junctions. Calculated results are compared with those of other papers and measurements, all show good agreement.
- 社団法人電子情報通信学会の論文
- 1996-03-25
著者
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Yamashita Eikichi
Department of Electronic Engineering, The University of Electro-communications
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Ma Zhewang
Department Of Electrical And Electronic Systems Saitama University
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Ma Zhewang
Department Of Electronic Engineering University Of Electro-communications
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Yamashita Eikichi
Department Of Electronic Engineering University Of Electro-communications
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Yamashita Eikichi
Department Of Electronic Engineering The University Of Electro-communications
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