VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level(Special Issue on Function Integrated Information Systems)

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概要

• 論文の詳細を見る

• An optimal allocation model for the subprocessing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density D and the parameter δ are also considered in order to acurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different D and δ are calculated. The simulation results indicate that, for any fixed average defect density D, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decrease, as D increases.

• 社団法人電子情報通信学会の論文
• 2001-11-01

著者

• Hao Y

  The Microelectronics Institute Xidian University

• ZHAO Tianxu

  the Microelectronics Institute, Xidian University

• HAO Yue

  the Microelectronics Institute, Xidian University

• JIAO Yong-Chang

  the Institute of Antennas and EM Scattering, Xidian University

• Jiao Yong-chang

  The Institute Of Antennas And Em Scattering Xidian University

• Zhao Tianxu

  The Microelectronics Institute Xidian University:the Department Of Mathematics Baoji College Of Arts And Science

関連論文

• VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level(Special Issue on Function Integrated Information Systems)

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