Fault Behavior and Change in Internal Condition of Mixed-Signal Circuits

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概要

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• The relationship between the change in transistor operation regions and the fault behavior of a mixed-signal circuit having a bridging fault was investigated. We also discussed determination of transistors to be observed for estimating the fault behavior. These results will be useful for modeling faulty behaviors and analyzing and diagnosing faults in mixed-signal circuits.

• 一般社団法人電子情報通信学会の論文
• 2000-04-25

著者

• Miura Yukiya

  The Author Is With The Graduate School Of Engineering Tokyo Metropolitan University

関連論文

• An IDDQ Sensor Driven by Abnormal IDDQ
• Fault Behavior and Change in Internal Condition of Mixed-Signal Circuits

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