A DFT Controller for Instruction-Based Functional Test

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概要

• 論文の詳細を見る

• This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.

• 社団法人電子情報通信学会の論文
• 2001-08-01

著者

• Kang S

  Yonsei Univ. Seoul Kor

• Kim Hong-sik

  The Authors Are With The Department Of Electrical And Electronic Engineering Yonsei University

• Kang Sungho

  The Authors Are With The Department Of Electrical And Electronic Engineering Yonsei University

• KIM Yong-Chun

  The author is with Samsung Electronics Co. Ltd.

関連論文

• A DFT Controller for Instruction-Based Functional Test

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