OTA-C Based BIST Structure for Anglog Circuits

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概要

• 論文の詳細を見る

• In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.

• 一般社団法人電子情報通信学会の論文
• 2000-04-25

著者

• Hsu C‐c

  Lunghwa Inst. Technol. Kueishan Taoyuan Twn

• Feng Wu-shiung

  The Author Is With The Department Of Electrical Engineering National Taiwan University

• Feng Wu-shiung

  The Authors Are With The Department Of Electrical Engineering National Taiwan University

• Hsu Cheng-chung

  The Author Is With The Department Of Electrical Engineering Lunghwa Institute Of Technology

関連論文

• Novel Gm-C Realizations of nth-Order Filters
• OTA-C Based BIST Structure for Anglog Circuits

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