Imaging GMR Sensors with Magnetic Force Microscopy Enhanced Surface Ion Milling

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概要

• 論文の詳細を見る

• In the development of an industry adaptable failure analysis technique for the study of ESD stressed GMR head is highly recommended. We developed a method with combined ion milling and MFM for GMR head failure analysis. This technique provides both fast sample preparation and characterization. It provides basically three observations of GMR film, including the roughness on the GMR element, the abutting junction, and the hard bias magnetization state. These three observations could provide a qualitative analysis on ESD damage of HGA.

• 社団法人電子情報通信学会の論文
• 2000-11-08

著者

• Hung Silas

  Magnetics Info Technology Center & Material Characterisation & Preparation Facility The Hong

• Hung Silas

  Magnetics Info Technology Center & Material Characterisation & Preparation Facility The Hong

• Wong C.

  Magnetic Information Technology Center(magic) Mcpf Hong Kong University Of Science And Technology

• Wong C.y.

  Magnetics Info Technology Center & Material Characterisation & Preparation Facility The Hong

• Zhang L.Z.

  Shen Zhen Kaifa Technology Co., Ltd, 7006 Kaifa Complex, Caitian Rd, Futian Dist., Shen Zhen, P.R.C.

• Bordeos Randy

  Shen Zhen Kaifa Technology Co., Ltd, 7006 Kaifa Complex, Caitian Rd, Futian Dist., Shen Zhen, P.R.C.

• Bordeos Randy

  Shen Zhen Kaifa Technology Co. Ltd 7006 Kaifa Complex Caitian Rd Futian Dist. Shen Zhen P.r.c.

• Zhang L.z.

  Shen Zhen Kaifa Technology Co. Ltd 7006 Kaifa Complex Caitian Rd Futian Dist. Shen Zhen P.r.c.

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• Imaging GMR Sensors with Magnetic Force Microscopy Enhanced Surface Ion Milling
• Imaging GMR sensors with magnetic force microscopy enhanced surface ion milling (マルチメディアストレージ--第5回アジア情報記録技術シンポジウム〔英文〕)

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