A Study on AMR Properties of Ni65Co35 Thin Film
スポンサーリンク
概要
- 論文の詳細を見る
Ni65Co35 (λs=0) thin film was prepared by RF magnetron sputtering method and themagnetoresistance(MR) ratios were measured by four-point probe method. MR properties as functions of certain sputtering parameters such as sputtering Ar pressure, bias voltage, subtrate temperature were investigated. The maximum MR ratio we obtained was 4.4%. In addition, the annealing kinetics of Ni65Co35 thin film was studied, and the thermal activation energy was obtained.
- 社団法人電子情報通信学会の論文
- 1996-11-22
著者
-
Shoubai Zhang
Information Storage Research Center, ShangHai Jiao Tong University
-
Chunshen Yang
Information Storage Research Center, ShangHai Jiao Tong University
-
Juntao Xu
Information Storage Research Center, ShangHai Jiao Tong University
-
Juntao Xu
Information Storage Research Centre Shanghai Jiaotong University
-
Chunshen Yang
Information Storage Research Centre Shanghai Jiaotong University
-
Shoubai Zhang
Information Storage Research Centre Shanghai Jiaotong University
関連論文
- Giant Magnetoresistance in CoCu Granular Alloy Films
- A Study on AMR Properties of Ni65Co35 Thin Film