Evaluation of Fatigue Crack Initiation and Extension Life in Microelectronics Solder Joints of Surface Mount Type
スポンサーリンク
概要
- 論文の詳細を見る
Fatigue tests on solder joints of surface mount type electronic package models were carried out at different temperatures, cycling frequencies and controlled displacement amplitudes in order to examine the crack initiation life Nc, crack extension rate da/dN, crack extension path and crack extension life. The crack initiation life(Nc)_<cal> of solder joints was estimated using maximum equivalent inelastic strain calculated by three-dimensional elasto-inelastic finite element method(3D-FEM). The ratios Nc/(Nc)_<cal> were found 2.4-9.8. Further, 2D-FEM crack extension analyses were performed to examine crack extension behavior. The FEM analyses showed that crack extension path and rate were controlled by maximum opening stress range at crack tip, Δσ_<θmax> in plastic zone under rather complicated stress tensor field. Experimentally obtained crack extension rate was found to be related to Δσ_<θmax> in FEM analysis as da/dN=β[Δσ_<θmax>]^α, with α=2.0 and β=2.65×10^<-10>mm^5/N^2 being determined independently of the test conditions. The calculated values of crack extension life by the FEM analyses using the above equation were in good agreement with the experimental ones.
- 一般社団法人日本機械学会の論文
- 1999-04-15
著者
-
TANEDA Motoharu
Faculty of Engineering, Yamaguchi University
-
Kaminishi Ken
Faculty Of Engineering Yamaguchi University
-
Iino M
Faculty Of Engineering Yamaguchi University
-
Iino Makio
Faculty Of Engineering Yamaguchi University
-
Taneda Motoharu
Faculty Of Engineering Fukuyama University
関連論文
- Dependence of Energy-Absorbing Capacity on Mechanical Properties Under Penetration
- Crack Initiation and Extension under Penetration of Thin Metal Sheet
- Energy-Absorbing Capacity of Ductile Thin Metal Sheet Under Quasi-Statical Penetration by Conical Punch
- Effect of Zinc Addition on Static- and Dynamic-SCC Properties of Al-Li-Cu 2090 Alloy
- Evaluation of Fatigue Crack Initiation and Extension Life in Microelectronics Solder Joints of Surface Mount Type