Measurement of Young's Modulus and Stress Analysis of a Magnetic Thin Film

スポンサーリンク

概要

• 論文の詳細を見る

• In order to evaluate the mechanical properties of a very thin film, this paper proposes a convenient method for separately determining Young's moduli of two thin films of a magnetic recording medium. Furthermore, the particular stress distribution inside a magnetic recording film (two bonded thin films) is analyzed. The internal stress in the medium is not uniform when the medium is subjected to unidirectional tension. The analysis shows that the difference in Poisson's ratio on two thin films causes flexure of the two bonded films under tension, as well as shearing stress at the interface between the magnetic layer and the substrate. Since the shearing stress may cause fatigue damage of the tape edge, detailed FEM analysis on its distribution is carried out.

• 一般社団法人日本機械学会の論文
• 1996-01-15

著者

• Murakami Yukitaka

  Faculty Of Mechanical Engineering Kyushu University

• Murakami Yukitaka

  Faculty Of Engineering Kyushu University

• Kishine Nobuyuki

  Recording And Imaging Science Laboratories Kao Corporation

• YANAI Hidetoshi

  Recording and Imaging Science Laboratories, Kao Corporation

• KOMABA Yukari

  Recording and Imaging Science Laboratories, Kao Corporation

• Yanai Hidetoshi

  Recording And Imaging Science Laboratories Kao Corporation

• Komaba Yukari

  Recording And Imaging Science Laboratories Kao Corporation

関連論文

• The Influence of Workpiece Geometry on Axial Hole Deviation in Deep Hole Drilling
• Notch Effect in Low-Cycle Fatigue : 1st Report, Low-Cycle Fatigue Strength of 0.48% Carbon Steel under Constant Load Amplitude
• Dependence of Threshold Stress Intensity Factor Range ΔK_ on Crack Size and Genometry and Material Properties : Series A : Solid-Mechanics, Strength of Materials
• Measurement of Young's Modulus and Stress Analysis of a Magnetic Thin Film

スポンサーリンク