全反射赤外分光法による陰イオン交換樹脂表面のポリスチレンスルホン酸の定量及び深さ方向分析

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概要

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• The quantitative determination and depth profiling of polystyrene sulfonic acid(PSS), which was adsorbed to the surface of anion-exchange resins, were examined by attenuated total-reflection Fourier-transform infrared spectroscopy (ATR). A calibration curve that was calculated from the amount of adsorption of PSS, and the relative intensity of PSS to the resin by micro ATR showed a linear relationship within 58〜718 mg, proving that it was possible to quantify PSS in this range. The depth profile of PSS was assumed an exponential function by secondary ion mass spectrometry (SIMS), and the relational expression of the relative intensity of PSS to resin by ATR and penetration depth (d_p) of infrared was deduced. The depth profile that was calculated from the relative intensity and d_p by variable-angle ATR was coincident with that of SIMS.

• 2004-05-05

著者

• 小堀 大二郎

  オルガノ株式会社

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