Preparation and Read/Write Performance of Contact SCC-MIG Heads

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概要

• 論文の詳細を見る

• A contact SCC-MIG gead with three contact pads was prepare by using the dry etching process, and its read/write performance was evaluated. The magnetic spacing of the contact system was estimated to be about 30nm and the bouncing height was 10nm. A D_<50> of 250 kFCI was achieved by using a gap length of 0.10μm and a track width of 1.2μm. The read/write performance can be theoretically improved by reducing the overcoat thickness and/or optimizing the gap length dependence, the read/write performance was significantly improved by using a small gap length in applications involving narrow magnetic spacing, such as contact recording.

• 社団法人日本磁気学会の論文
• 1998-04-15

著者

• Suemitsu K

  Functional Devices Research Laboratories Nec Corporation

• Sato A

  Functional Devices Research Laboratories, NEC Corporation

• Tsuboi S

  Functional Devices Research Laboratories, NEC Corporation

• Tsukamoto Y

  Functional Devices Research Laboratories, NEC Corporation

• Takami M

  R&D Center, Minebea Co., Ltd.,

• Iwakura M

  R&D Center, Minebea Co., Ltd.,

• Kawashima S

  R&D Center, Minebea Co., Ltd.,

• Iwakura M

  R&d Center Minebea Co. Ltd.

関連論文

• Preparation and Read/Write Performance of Contact SCC-MIG Heads

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