Spin Resolved SXAPS for Ni
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概要
- 論文の詳細を見る
The soft x-ray emission intensity from Ni (110) surface was measured by appearance potential spectroscopy with spin polarized electrons near 2p electron threshold energy. The pulse count measurements of x-ray intensity instead of ordinary SXAPS measurements with lock-in technique made it possible to obtain knowledge of effects not only the characteristic x-ray but bremsstrahlung x-ray on spectra. The spectra reveal the invalidity of ordinary APS theory based on one electron approximation for Ni.
- 社団法人日本磁気学会の論文
- 1999-01-20
著者
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SUZUKI Y.
Faculty of Agriculture, Kyushu University
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Fujii J.
Faculty of Science Gakushuin Univ.
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Mizoguchi T.
Faculty Of Science Gakushuin University
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