順序回路の検査パターン作成の発見的一手法

概要

論文の詳細を見る
With the advent of LSI, the problem of test for LSI and IC cards increasingly becomes difficult.To cope with the difficulty,there are two approaches:one is to design easy-testable circuits, the other is to develop powerful algorithms for test data generation of logical circuits.As to the test data generation algorithms lt seems through our study that the conventional algorithms require more complicated Program structure and more computer time to process relatively large circuits with more than 50O logic block.This papers concerned with the new heuristic test data generation algorithm,called M0M1algorithm.This algorithm is theoretically based on special type of values expressed in Boolean vectors,their logical Operations,and several basic theorems.In implementation,the algorithm Enjoys the advantage that the main process is simple logical operations of Boolean vectors and backward search on the state table without tedious table operations.
一般社団法人情報処理学会の論文
1975-02-15