A New Heuristic Test Sequence Generation Algorithm for Sequential Circuits
スポンサーリンク
概要
著者
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Okuda Jiro
Engineering Department Electronic Switching Div. Nippon Electric Co. Ltd.
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Amamiya Goro
Engineering Department Electronic Switching Div. Nippon Electric Co. Ltd.
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Tsuboya Mitsukuni
Engineering Department, Electronic Switching Div., Nippon Electric Co., Ltd.
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Arima Toshihiro
Engineering Department, Electronic Switching Div., Nippon Electric Co., Ltd.
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Arima Toshihiro
Engineering Department Electronic Switching Div. Nippon Electric Co. Ltd.
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Tsuboya Mitsukuni
Engineering Department Electronic Switching Div. Nippon Electric Co. Ltd.