Spectroscopic Studies of Thin Film Electron Trapping Optical Memory Media (CaS : Eu, Sm)

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概要

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• Films of the potential electron trapping optical memory medium CaS : Eu, Sm produced from optimally composed sputtering targets, are themselves optimized by post-deposition thermal processing in a sulfur atmosphere. X-ray diffraction studies and a variety of spectroscopic techniques are used to study the development of crystalline structure and the deployment of the active Eu and Sm species within the CaS host lattice.

• 社団法人日本磁気学会の論文
• 2002-10-01

著者

• Wu Jianping

  Centre For Data Storage Materials School Of Science & Engineering Coventry University

• Newman Dave

  Centre for Data Storage Materials, School of Science & Engineering, Coventry University

• Viney Ian

  Centre for Data Storage Materials, School of Science & Engineering, Coventry University

• Viney Ian

  Centre For Data Storage Materials School Of Science & Engineering Coventry University

• Newman Dave

  Centre For Data Storage Materials School Of Science & Engineering Coventry University

関連論文

• Spectroscopic Studies of Thin Film Electron Trapping Optical Memory Media (CaS : Eu, Sm)
• Developing the Potential of Plasmon Enhancement in Perpendicular (PtCo Multilayer) Magneto-Optic Recording Media

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