Experimental Validation of T^*_ε Integral

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概要

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• T^*_ε integral, which includes J integral as a special case, is shown to be a material property suitable for characterizing crack propagation in thin 2024-T3 aluminum sheets. The T^*_ε resistance curve, which was generated through stable crack growth tests of single edge-notched (SEN) and central notched (CN) specimens, were used to predict curved crack growth and crack link-up of in-line multiple cracks. T^*_ε integral for rapid crack growth reached a maximum value at the terminal crack velocity.

• 一般社団法人日本機械学会の論文
• 2001-10-20

著者

• Atluri Satya

  University Of California Center For Aeronautical Research And Education

• Kobayashi Albert

  University of Washington, Department of Mechanical Engineering

• Kobayashi Albert

  University Of Washington

• Kobayashi Albert

  University Of Washington Department Of Mechanical Engineering

関連論文

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