OS6(2)-5(OS06W0390) Deformation Modes of Semi-Conductors : Determined from Nano-Indentation and Transmission Electron Microscopy
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概要
- 論文の詳細を見る
- 一般社団法人日本機械学会の論文
- 2003-09-09
著者
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Williams J.
Electronic Materials Engineering Australian National Univ.
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Bradby J.
Electronic Materials Engineering, Australian National Univ.
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Munroe P.
Electron Microscopy Unit, Univ. of New South Wales
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Swain Miehael
Biomaterials Science Research Unit, Faculties of Engineering and Dentistry, The Univ. of Sydney
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Bradby J.
Electronic Materials Engineering Australian National Univ.
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Munroe P.
Electron Microscopy Unit Univ. Of New South Wales
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Swain Miehael
Biomaterials Science Research Unit Faculties Of Engineering And Dentistry The Univ. Of Sydney