Measurement of Residual Stress in a Sphere by X-Ray Under the Consideration of its Penetration Depth
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概要
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Applying the fundamental formula which has been derived by them from the consideration on a physical phenomenon of contribution of the internal stress in a definite subsurface layer of metal to the X-ray diffraction, the authors propose an exact theory of residual stress measurement for the Front Surface Method by successive thin layer removal in a sphere of a ball bearing by using the characteristic X-ray of Cr.
- 一般社団法人日本機械学会の論文
著者
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Ukai Takayoshi
Faculty Of Engineering Hokkaido University
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Doi Osamu
Faculty Of Applied Biological Sciences Gifu University
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