Statistical Study on Improvement in Precision in X-Ray Stress Measurement by Fixed Time Method : Standard Deviation of Stress due to Statistical Fluctuations in Diffracted Intensities

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概要

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• The equations for the standard deviation (s.d.) of the stress measured by n points parabola and the Gaussian curve fitting methods are given. The peak position of a diffraction line calculated by the parabola method becomes q=x_<m+1> - d (Σt_iz_i)/(ΣT_iZ_i) where, m=n(n-1)/2, x=2θ゜, t_i=i-1-m, c=x_<i+1>-x_i, d=(n^2-4)c/10, T_i=3t^2_i -(n^2-1)/4, and Z_i=accumulated counts(y) corrected for LPA factor. The s.d. of the stress p by the sin^2ψ method (ψ_0=0゜, 15゜, 30゜, 45゜) is given approximately by [numerical formula] where, Y=y_<m+1> and R=(y_1+y_n)/(2Y) at ψ_0=30゜. The stress has been determined to within s.d. of 1 〜 2 kg/mm^2 for a hardened steel S50C having a broad diffraction line with a half breadth of about 8 degrees 2θ.

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著者

• Kurita Masanori

  Assistant Faculty Of Technology Tokyo Metropolitan University

関連論文

• Statistical Study on Improvement in Precision in X-Ray Stress Measurement by Fixed Time Method : Standard Deviation of Stress due to Statistical Fluctuations in Diffracted Intensities

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