A Statistical Analysis of the Stress Measurement by X-Ray Difraction in Counter Method

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概要

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• The effect of the scatter in the peak position y on that in the residual stress p measured by x-ray diffraction is studied. The variance, σ^2_p, of the stress is given by σ^2_p=C^2Σ^^4__<i=1>β^2_iσ^2_i where σ^2_p is the variance of y and i=1〜4 correspond to x-ray incident angles ψ_0=0°. 15°, 30°, and 45°. C and β_i are constants. By using this equation, the variances of the stresses obtained by various two and multiexposure methods were calculated. The validity of the assumptions made in the statistical formula for the confidence interval of the stress is investigated, and the consequences of failure of some of these assumptions are discussed. The residual stress measurement was made on three kinds of surface conditions of the mild steel. The effect of a time constant on the stress was also investigated.

• 一般社団法人日本機械学会の論文

著者

• Kurita Masanori

  Faculty Of Engineering Tokyo Metropolitan University

関連論文

• The Work-Hardened Surface Layer and the Crossing of the S-N Curves
• A Statistical Analysis of the Precision of the X-Ray Stress Measurement for the Counter Method - Theory
• A Statistical Analysis of the Stress Measurement by X-Ray Difraction in Counter Method

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