STM Images of Surface Films Produced at Elevated Temperatures
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概要
- 論文の詳細を見る
The scanning tunneling microscope (STM) has an atomic-level resolution. Oxide film is always formed at elevated temperatures in air. Therefore, STM observation of surface films is useful for investigating the basic mechanisms of damage such as oxidation and creep at elevated temperatures. In this study, the oxide films on nickel and iron, and the sulfur-segregated surfaces on iron and SUS304 steel were observed with STM at room temperatures in air. The images of these films were obtained under a high bias voltage such as 2V, in comparison with ordinary voltage such as 20mV. This was justified by the fact that the films were semiconductors.
- 一般社団法人日本機械学会の論文
- 1992-10-15
著者
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Ochi Yasuo
Department Of Mechanical And Control Engineering The University Of Electro-communications
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Ochi Yasuo
Department Of Mechanical And Control Engineering University Of Electro-communications
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Masuda Hiroyuki
Tokyo University of Science
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MASUDA Hiroyuki
National Institute for Materials Science
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Matsuoka Saburo
Environmental Performance Division National Research Institute For Metals
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Ikeda Yuji
Failure Physics Division National Research Institute For Metals
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Masuda H
National Research Institute For Metals
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Masuda Hiroyuki
Department Of Life Science University Of Tokyo
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Masuda Hiroyuki
Failure Physics Division National Research Institute For Metals
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Akaike Kazuhiro
Graduate Student Department Of Mechanical And Control Engineering University Of Electro-communicatio
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Ochi Yasuo
Department of Bioscience and Chemistry, Faculty of Agriculture, Hokkaido University
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