写真法によるX線応力測定法における露出時間について
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概要
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To measure the lattice distortion from the diffraction pattern due to characteristic X-rays and there from to determine the residual stress is a very effective method of nondestructive inspection. In the industrial application of this method, it is necessary to preliminarily clarify the possible errors induced in the measurement. This method is supposed to cause various errors in measurements. Earlier, geometrical errors in X-ray radiography and possible errors in distance measurements of diffraction ring were theoretically and experimentally discussed. A proposal was made, and it was reported that the experimental value of lattice distortion was far larger than its theoretical value. In the present paper, by way of solving these problems, it was experimented how the duration of exposure in radiography induces an error. As commonly practiced in the Glocker method and the sin^2Ψ method and others, the lattice distortion in each orientation is found before determining the stress, this lattice distortion can be detected by radiographing the diffraction pattern with the specimen surface tilted at varied angles (Ψ) to the incident X-rays. Thereby, the distance measurement of diffraction ring has been made by means of a micro-photometer, and accordingly, the density of film back ground plays an important role. The films have no equal density of background, particularly in the films taken at heavily tilted angles there is a considerable difference in density between right and left even in the same piece of film. To find how in such conditions the measuring errors of diffraction rings occur from one another, vertical radiography with different film densities under different exposures was made and the results were analyzed. Though this analysis, it was revealed that the scattered ray had been mainly responsible for the errors. This scattered rays are divided into the primary one from the specimen surface and the secondary one reflected from the metal part like the film cassete. It is predictable that the latter has a larger bearing on the errors.
- 社団法人日本材料学会の論文
- 1964-12-15
著者
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