Current-driven Vortex Dynamics at Zero Field in Thick and Thin Films Probed by Voltage Noise(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
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概要
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We have measured current (I)-induced voltage (V) noise S_v of thick and thin amorphous Mo_xSi_<1-x> films with different transition temperatures T_c, but with similar critical current densities, to study vortex dynamics driven by I at zero field below T_c. Origin of noise is due to density fluctuations of thermally created free vortices and antivortices in the presence of I. With increasing temperature T, S_v/V shows a decrease and tends to zero near T_c, where S_v/V for the thick and thin films follows the single scaling functions expressed as S_v/V = A(l - T/T_c)^n (n ≈ 5-6) with large and small values of A, respectively. This means that the physical mechanism responsible for the T dependence of noise (or vortex-density fluctuations) for the thick and thin films is qualitatively similar, but quantitatively dominated by the dimensionality.
- 社団法人日本物理学会の論文
- 2004-10-15
著者
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Kamada M.
Research Center For Development Of Far-infrared Region University Of Fukui
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Okuma S.
Research Center For Low Temperature Physics Tokyo Institute Of Technology
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- Current-driven Vortex Dynamics at Zero Field in Thick and Thin Films Probed by Voltage Noise(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)