Compton Profiles of Silver with 662 keV γ-Rays
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概要
- 論文の詳細を見る
The isotropic Compton profiles of Ag for two thicknesses, 2 mm and 4 rum, havebeen measured by means of 662 keV 7-rays from Cs"' source. A llpGe detector withresolution of 190 eV at 5.9 keV was used to detect the backward scattering photons.Comparison with the renormalized-free-atom model calculations was made, and theagreement between the experimental and the calculated values has been found to begood for the electron configuration 4d"5s'.
- 社団法人日本物理学会の論文
- 1991-12-15
著者
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Chen Chuhn-chih
Department Of Physics National Taiwan Normal University
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Chang Chu-nan
Department Of Physics National Taiwan Normal Univercity
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LEE Syh-Bin
Department of Physics,National Taiwan Normal University
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Lee Syh-bin
Department Of Physics National Taiwan Normal University