LEED Investigation on Temperature Dependence of Sublattice Magnetization of NiO (001) Surface Layers

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概要

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• Temperature dependence of the exchange diffraction spot intensity from thecleaved face (001) of nickel oxide is measured for the cases of very small andcomparatively large penetration depth of electron beam concerning the surfacebarrier resonance in LEED. The exchange reflexion intensity is corrected for theDebye-Waiter factors in order to reveal the temperature dependence of the sub-lattice magnetization. The effective critical exporuent of the sublattice magnetiza-tion is determined to be 0.89j0.01 as the proper value for the top-most surfacelayer. The thickness of the sut'face layers, which is characterized by the same valueof the critical exponent as the top-most surface layer, becomes thicker than themean absorption distance when the temperature is raised up to 0.9 in TNT..

• 社団法人日本物理学会の論文
• 1978-01-15

著者

• Namikawa Kazumichi

  Institute For Solid State Physics University Of Tokyo

関連論文

• Intensity Behaviour of Exchange Reflexions in LEED from an Antiferromagnetic Crystal
• Exchange Reflexions in Low Energy Electron Diffraction from Antiferromagnetic Nickel Oxide Crystal
• LEED Investigation on Temperature Dependence of Sublattice Magnetization of NiO (001) Surface Layers

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