Resonant Scattering of Photons in Mg and Si

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概要

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• An NaI(TI) scintillation spectrometer was used to study the resonant scattering of photons generated the bremsstrahlung x-rays. The resonant levels were found at 10.2 and 9.3 MeV in Mg and at 11.3 MeV in Si. Their level widths were obtained the self absoption method. They are 3.8 eV and 0.9 eV in Mg, and 8.3 eV in Si, respectively. The spins and parities of these levels were assigned to be 1^+ considering the isotopic spin multiplets.

• 社団法人日本物理学会の論文
• 1961-10-05

著者

• Sugawara Masumi

  Department Of Physics Faculty Of Science Tohoku University

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