Dielectric Relaxations and Electrical Transport Due to Nonadiabatic Small Polarons in p-Type Nio Doped with Li

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Dielectric properties and dc-conductivities in p-type Ni0 doped witlt Li (1 - 10atomic%) were investigated below 300 K. Around 40 K, a dielectric relaxation peakappeared with an activation energy of 0.051 eV and the intensity of tlais peak wasfound to be thermally activated, the activation energy being 0.01 eV. l'here was alinear relation between log (oT"') and 1 / T in the range of - 45 to 7 90K and tlteactivation energy was 0.057 eV. These beFuaviours have been discussed in terms ofhopping process of nonadiabatic small polarons. The theoretical estimates of elect-ron-phonon-coupling constants, ), and the changes in spacings between ion?s, ,v, asso-ciated with formation of a polaron have been carried out. Tlae calculations yield ,11and x between Ni" and Ni"in (110)directioxasare -3.48 eV/Aand -9.6x 10 'Aand these between Ni" and 0' in (100) directions are 0.42 eV/A and 5,12 x 10-'A. This theoretical calculation provides an evidence on stability of nonadiabatic smallpolarons in p-type Nip.[die1ectric relaxajion, p-type Nip, nonadiabatic small polarons, polarotaic con- 1] duction, electron-phonon interaction, electroxa-phonon-coupling constant {
社団法人日本物理学会の論文
1992-09-15