Photoionization Cross Sections of Xenon in the L Edge Region

概要

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The total photoion yields of xenon have been measured in the L-shell ionizationregion covering the photon energy from 4.6 to 6.1 keV with the step width ofwavelength scans of about 0.0025 A. Monochromatized undulator radiation was usedas a light source and crossed with an atomic xenon beam. Sharp peaks at the L. andL. edges, which had not been observed in previous work, are clearly seen in the presentdata. It can be suggested that these peaks are due to the photoexcitation of 2p elec-irons to the unfilled higher levels. Furthermore, a structure above the L, edge whichsuggests deviations from the power lawlike energy dependence predicted by an in-dependent electron model can be seen in the present data. This structure might be dueto simultaneous two-electron excitation.
社団法人日本物理学会の論文
1989-01-15