X-Ray Structure Investigation of Single Crystals of SnTe Doped with the Various 3d Transition Elements of Cr,Mn,Fe,Co and Ni

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概要

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• X-ray diffraction data from as-grown and annealed single crystals of Sn. ,(Me).Te(Me = Cr, Mn, Fe, Co aid Ni; x ranges from 0.5 at% to 5.0 ate) were collected usingthe Syntex P2. four-circle diffractometer and subsequently analysed using theSHELX-76 computer programmes to obtain the relative shifts in positions of Sn anddopant, Me, in a unit cell. It has been found that substitution occurs on dopingwhereby the Me ton replaces the Sn Ton. In addition, the Sn and Me ions are displacedfrom the original undoped Sn ion positions.

• 社団法人日本物理学会の論文
• 1988-11-15

著者

• Fun Hoong

  X-ray Crystallography Unit School Of Physics University Sains Malaysia

• Yeoh T.S.

  School of Physics,Universiti Sains Malaysia

• Teoh S.G.

  School of Chemistry,University of Science of Malaysia

• Fun H.K.

  School of Physics,Universiti Sains Malaysia

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• X-Ray Structure Investigation of Single Crystals of SnTe Doped with the Various 3d Transition Elements of Cr,Mn,Fe,Co and Ni

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