X-Ray Topographic Observation of Stacking Fault in KCl

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概要

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• Two dimensional lattice defects in KCI crystal were observed by means ofoptical and X-ray topographic methods. The defects produced three types of thediffraction images on X-ray topographs, that were the symmetric and asymmetricones for .J. g of reciprocal lattice vectors, and the diffuse images for any g. Fromthe appear-disappear relation for various g and the geometrical consideration,it was concluded that the defects are stacking faults, and the fault vector is nearlya76(211) which is anti-parallel to the Burgers vector of Shockley partial dis-location in fcc structure, and that the stacking fault is accompanied with anexpansion distortion perpendicular to the {Ill} fault plane. The defects givingasymmetric or diffuse images are concluded to be formed by the superpositionof simple stacking faults.

• 社団法人日本物理学会の論文
• 1983-09-15

著者

• Hattori Hiroyuki

  Physical Laboratory Faculty Of Education Fukui University

関連論文

• X-Ray Topographic Observation of Stacking Fault in KCl

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