K X-Ray Spectra from Si and SiO_2 after Oxygen Excitation

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概要

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• A beam of 30 MeV oxygen ions was used to excite silicon atoms in both a silicon crystal and in a silicon dioxide crystal. The resulting K X-ray spectra show marked deviation from one another.

• 社団法人日本物理学会の論文
• 1973-04-05

著者

• Olsen David.

  Center For Nuclear Studies University Of Texas

• MOORE C.

  Center for Nuclear Studies, University of Texas

• MCWHERTER Joseph.

  Center for Nuclear Studies, University of Texas

• Mcwherter Joseph.

  Center For Nuclear Studies University Of Texas

• Moore C.

  Center For Nuclear Studies University Of Texas

• Moore C.Fred

  Center for Nuclear Studies, University of Texas

• Richard Patrick

  Center for Nuclear Studies, University of Texas, Austin, Texas 78712, U.S.A.

関連論文

• K X-Ray Spectra from Si and SiO_2 after Oxygen Excitation

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