Exciton Quantization and Polariton Interference in Thin Films:Comparison of Different Approaches

概要

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In search for an accurate and convenient method to calculate optical properties ofexcitons in thin films as a non-local response, a comparison is made among thedifferent frameworks available for different regions of film thickness (d). A detaileddiscussion is given about the multi-mode nature of polariton interference in opticalspectra. The exciton levels in (]aAs films with d>2.5a. are shc>wn to follow approximately the center-of-mass quantization. The measured reflectance spectra for GaAsfilms with d g 4800 A are reasonably interpreted in terms of tltree-branch polaritonsarising from light- and heavy-mass excitons.
社団法人日本物理学会の論文
1990-05-15