An Electron Microscope and Electron Diffraction Study of Fine Manganese Particles Prepared by Evaporation in Argon at Low Pressures

概要

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Fine manganese particles prepared by evaporation in argon, or in xenon, at low pressures were studied mainly by electron microscopy and electron diffraction. The particles showed clear-cut crystal habits and they were classified into three types; firstly, particles of the shape of a tristetrahedron bounded by twelve {211}-planes, the crystal structure of which was α-man-ganese; secondly, particles of the shape of a rhombic dodecahedron bounded by twelve {110}-planes, the crystal structure of which was β-manganese, thirdly particles of the shape of a needle-like rod, the crystal structure of which is still unknown. Extra spots {00l}-planes, the crystal structure of which was β-manganese, thirdly particles of the shape of a needle-like rod, the crystal structure of which is still unknown. Extra spots {00l}, (l〓4n), observed in the selected area diffraction pattern from a β-manganese particle are explained by dynamical double reflections.
社団法人日本物理学会の論文
1969-05-05