Diffuse Patterns in Slow Electron Diffraction from Cleaved Faces of Zincblende Crystals

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概要

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• By use of a slow electron diffraction apparatus of the wide-angle display type with cylindrical grids and fluorescent screen, the general feature of diffuse patterns from zincblende cleaved faces were studied with electrons in the energy range from 200eV to 500eV. The behaviours of diffuse spots with crystal rotation and the observed directions of diffuse streaks are found to be essentially similar to those observed in high-energy case. The energy loss value of diffuse spots is estimated to be less than 2eV. It is probable that the energy loss processes giving rise to these diffuse spots are mostly due to electron-phonon interactions in the crystal.

• 社団法人日本物理学会の論文
• 1968-12-05

著者

• Hayakawa Kazunobu

  The Institute For Solid State Physics The University Of Tokyo

関連論文

• A New Slow Electron Diffraction Apparatus
• Auger Electron Emission from Gold Deposited on Silicon (111) Surface
• Diffuse Patterns in Slow Electron Diffraction from Cleaved Faces of Zincblende Crystals

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