Differential Cross Section Measurements for One-Electron Capture Process in Ar^<2+>-Ne System at E_<lab>=40, 60 and 80 eV

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概要

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• The angular distribution of Ar^+ ions produced by one-electron capture process was measured from 0° to 20° with a newly constructed crossed-beam apparatus. Two components were observed in the angular distribution of Ar^+, one component is a sharp peak around 0° and the other is a hump around the reduced scattering angle E_<lab>・θ_<lab>=290±20 eV・deg. Only the following process is considered in the analysis of the experimental results : Ar^<2+>(^3P)+Ne(^1S_0)→Ar^+(^2P)+Ne^+(^2P)+6.1 eV. The experimental results were compared with those obtained by pure classical trajectory calculations taking into account simple interaction potentials. The observed Ar^+ ions in the forward peak were considered to be produced in a charge transfer process which occurs in the incoming channel of the trajectory, and the ions in the hump change charge in the outgoing channel.

• 社団法人日本物理学会の論文
• 1994-03-15

著者

• Itoh Yoh

  Physics Laboratory Faculty Of Science Josai University

• Itoh Yoh

  Physica Laboratory Josai University

関連論文

• Differential Cross Section Measurements for One-Electron Capture Process in Ar^-Ne System at E_=40, 60 and 80 eV
• CROSSED BEAM EXPERIMENT OF VERY SLOW HIGHLY CHARGED ION - ATOM AND MOLECULE COLLISION USING RIKEN ECRIS

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