Complex Observation in Electron Microscopy.I.Basic Scheme to Surpass the Scherzer Limit

概要

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A novel observation scheme, terzned the complex observation, which is faithful to reconstrtuctoptical iunages carried by either electromagnetic or material waves in their intrinsic complex form,is proposed. This observation is based completely on the coherent microscopy and cornprised ofa triple experinaent consisted of twin experirnents restoring two linear terms corresponding to thereal and urnagunary part of complex iznages and an additional experiment to cancel the sqtuareterm wlaich is in company with either linear terrn, A linear combination of three irnages obtainedthrough the triple experiment is able to exhibit a counplex quantity in the form to be ntmmericallymaniptrlated without rtmpture according to the forunal tlaeory of image formation. lVIaniptrlationof the phase and the intensity of primary waves penetrating through objects is the key in thisobservation. The basic scheme is applied to settle the long-standing isstte in electron znicroscopythat the point resolution is impaired by the rnodtrlated contrast transfer, which originates fromlens aberrations and defocusing. A computer simulation illustrates a unodulation-free iunage witha drastic improvement on the contrast as well as the point resolution compared with the threeoriginals trtilized for the iznage reconstrtrction,
社団法人日本物理学会の論文
1999-03-15