Spin-Lattice Relaxation of Shallow Donors In Heavily Doped Si
スポンサーリンク
概要
- 論文の詳細を見る
A theory is proposed to explain the dependence of spin-lattice relaxation rate, 1/T_s, of donors on the concentration and the degree of compensation. In the theory donor electrons are classified into two groups according to their spin-lattice relaxation rate being rapid or slow. The first is those electrons belonging to the close pairs of phosphorus atoms which are few in number. One site of a close pair is occupied and the other occupied. These electrons relax rapidly through the hopping motion accompanied by reversal of spin orientation. The second group is those electrons associated with the isolated phosphorus atoms. They approach to the first group via the hopping motion without changing their spin orientations and finally relax at the sites of the fast-relaxing centers associated with the first group. Qualitative agreement between calculation and the experimental data of Igo is obtained with the exception of the heavily compensated samples.
- 社団法人日本物理学会の論文
- 1963-07-05
著者
-
Sugihara Ko
Technical Research Department Wireless Division Matsushita Electric Industrial Co.
-
Sugihara Ko
Technical Research Laboratory Wireless Division Matsushita Electric Industrical Co. Ltd.
-
Sugihara K.
Technical Research Laboratory, Wireless Division, Matsushita Electric Industrical Co., Ltd.
関連論文
- A Note on the Magnetic Resonance in Metals
- Electrical Conductivity of Graphite
- Spin-Lattice Relaxation of Shallow Donors In Heavily Doped Si