Measurement of Microwave Dielectric Constants of Ferroelectrics Part II. Dielectric Constants and Dielectric Losses of NaNO_2 and (Glycine)_3・H_2SO_4

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概要

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• Dielectric constants and loss tangents of NaNO_2 and (Glycine)_3・H_2SO_4(TGS) single crystals have been measured at 3.3 kMc/s by the resonant cavity method from room temperature to 200℃ for NaNO_2 and to 80℃ for TGS. Dielectric constants measured along the b-axes of the both crystals at 3.3 kMc/s are smaller than those at 1 Mc/s. No dielectric dispersion has been observed along the a- and c-axes of NaNO_2. Dielectric constants along these axes increase monotonically with temperature. The mechanisms of the dielectric dispersion of the both crystals are discussed in connection with their spectroscopic properties and crystal structures.

• 社団法人日本物理学会の論文
• 1962-06-05

著者

• Nakamura Eiji

  Department Of Physics Faculty Of Science Hokkaido University

• Nakamura E.

  Department of Physics, Faculty of Science Hokkaido University

関連論文

• Dielectric Properties of SbSI at Microwave Frequencies
• A Note on the Classification of Ferroelectrics
• Measurement of Microwave Dielectric Constants of Ferroelectrics : Part I. Dielectric Constants of BaTiO_3 Single Crystal at 3.3KMc/s
• Measurement of Microwave Dielectric Constants of Ferroelectrics Part II. Dielectric Constants and Dielectric Losses of NaNO_2 and (Glycine)_3・H_2SO_4

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