X-ray Line Broadening from the Polished Surfaces of Silver and Gold

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概要

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• The linear relation (Hall's formula) and the quadratic relation between the integral breadth and the scattering angle can be derived from the general formula for intensity distribution by the assumption of the appropriate distribution for both size and strain. The use of these two formulae (line breadth method) can give not only the magnitude but also the plausible distribution for strain and size. The advantage of this method consists in the point that the magnitude and the distribution for size and those for strain can be separately obtained, in contrast with the Fourier analysis of line profile (line profile analysis method). The line breadth method is applied to the polished surfaces of Ag and Au and the results obtained are confirmed to be correct by the line profile analysis. On the other hand, the line profile analysis is required to study the strain variation with the depth in specimens, as far as only one kind of radiation is used. This strain variation can be observed by the line breadth method with the use of different radiations, and the comparison is made between the results from the line breadth method and from the line profile analysis method.

• 社団法人日本物理学会の論文
• 1960-08-05

著者

• Kuriyama Masao

  The Institute For Solid State Physics University Of Tokyo

関連論文

• Ferromagnetic Resonance Absorption of Single-Crystal Thin Films of Nickel
• X-ray Line Broadening from the Polished Surfaces of Silver and Gold

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