2C03 表面安定化強誘電性液晶のnarrow wall局所層構造の放射光微小領域X線回折法による評価

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概要

• 論文の詳細を見る

• The local layer structure(LLS) at the narrow wall (lightening) of the zigzag defect in surface stabilized ferroelectric liquid crystals was characterized using synchrotron X-ray micro-diffraction. An X-ray beam size used was 5 μm or 2.5 μm. A liquid crystal used was CS1014. The diffracted intensity was measured as functions of θ, χ and Y(position). At the narrow wall running parallel to the rubbing direction, the LLS was a pseudo- bookshelf structure with an angle of 16° between the layer normal and the rubbing direction. The bookshelf structure also bent in the θ direction. At the inclined narrow wall, the LLS showed a larger bend in θ direction as well as the inclination in χ direction. The layer normal made a larger angle with the rubbing direction.

• 日本液晶学会の論文
• 1995-09-10

著者

• 飯田 厚夫

  高エネ研・放射光

• 野間 敬

  キャノン中研

• 宮田 浩克

  キャノン中研

関連論文

• 3B02 X線マイクロビームによる反強誘電性液晶水平配向セルの局所的層構造解析
• 2C03 表面安定化強誘電性液晶のnarrow wall局所層構造の放射光微小領域X線回折法による評価
• 2F606 強誘電性液晶局所層構造の電場依存性のX線マイクロビーム解析

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