組合せ回路のテストおよびテストセツト数の考察
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概要
- 論文の詳細を見る
Number of tests in a test set and the variety or the number of the test sets of combinational circuit are studied using structured test table or matrix. The test table which we have proposed can represent the test set systematically and gives a methed to account the number of tests. First, number of the tests of two level tree like circuits are derived, and the maximum value of n + l, minimum value of 2√<n>, where n is the number of input line of circuit. The numbers of test set are derived, and those of other topological circuits are also discussed based on the results of the standard two level circuit. Second, upper and lower bound of the number of test of the circuits which have reconvergent paths are derived. Further the effect of the reconvergent paths to the number of tests, test sets and disappearance of test are also discussed.
- 帝京平成大学の論文
- 1995-04-01