Rb原子発振器の位相雑音の測定

概要

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One gauge of the performance of electronic devices which require high staility is their frequency stability. Frequency stability can be expressed in two ways : in the time domain and in the frequency domain. Phase noise determines short-term stability in the frequency domain and is an essential factor in evaluating device performance. In this study, we evaluated the short-term frequency stability of high-stability oscillators by a phase noise measurement system. The phase noise of two Rb atomic oscillators were measured against a reference 5 MHz crystal oscillator using a HP 3048 A phase noise measurement system. The two atomic oscillators showed almost the same characteristics. Below a Fourier frequency of 10 MHz, the ohase noise of the oscillators was smaller during free running than under control.lt is considerd that the control applied for reducing the effect of aging of the crystal oscillator in the atomic oscillator increased the ohase noise in the low Fourier frequency range.
東京工芸大学の論文
1989-01-15