<論文>電子部品めっき皮膜のウイスカー発生障害調査とその対策研究

概要

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Electronic Devices has been geting more popular in our social life. On the other hand they have to be produced higher and more strict specification. Especially, the higher durability is required for electric communication equipments for satelit, underground and submarin, which have to endure as long as 20 years. In contrast, consumer-use equipments is less than 10 years. This is because the fomer is to be used under severer circumstances than the latter. We have frequently an obstacle to reliablity of heavy-duty electronic components. It is called "Out-break of Metal Whisker." This reaction takes place on the surface of electro-plated components which have been left in the field for several years. These whiskers causes short-circuit damages. In this paper we show the results of analysis on damages caused by metal whiskere and propose prevention measures aganst such damages.
東京工芸大学の論文
1998-03-31