走査型X線分析顕微鏡画像の解析による層状斑れい岩の鉱物分布マップの作成

概要

論文の詳細を見る
The pixel-intensities from X-ray fluorescence (XRF) images of a layered gabbro obtained using a scanning X-ray analytical microscope (SXAM) have been used to produce mineral-distribution images or maps of the layered gabbro. Maps of the major elements, including Al, Si, Ca, Fe, were obtained with the SXAM. To transform these elementdistribution maps into mineral-distribution maps, we employed the Togami et al. (1998)'s method : a least squares method. The coefficient of XRF intensity and the proportion of a desired mineral was determined from the average value in a few thousand pixels that record the XRF intensity of the desired mineral in isolation. Experiments with the gabbro sample showed that the least squares method gives appropriate mineral-distribution maps if the acquisition time for the XRF maps is sufficiently long : e.g., at least 24 hours for the gabbro.
静岡大学の論文