<Abstract>Development of Novel Characterization Method of Evaluate Modal Birefringenece and Polarization Mode Dispersion Based on Optical Frequency Domain Interferometry
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概要
著者
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Namihira Yoshinori
School Of Engineering Ryukyu University
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Yamanaka Masaki
Course Of Electro Photo Optics Tokai University
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Wakaki Moriaki
Course Of Optics And Photonics Department Of Applied Science Tokai University
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NISHIZAWA Koichi
Information Engineering of polytechnic University
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OHTSUKA Yoshihiro
Hokkaido University
関連論文
- Recent Development of Far Infrared and Submillimeter Detectors for Astronomical and Astrophysical Observations
- Development of Novel Characterization Method of Evaluate Modal Birefringenece and Polarization Mode Dispersion Based on Optical Frequency Domain Interferometry