Mitigating artifacts in back-projection source imaging with implications for frequency-dependent properties of the Tohoku-Oki earthquake
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概要
- 論文の詳細を見る
- 2012-12-01
著者
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AMPUERO Jean-Paul
Seismological Laboratory, California Institute of Technology
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NI Sidao
CAS Key Laboratory of Dynamical Geodesy, Institute of Geodesy and Geophysics
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LUO Yingdi
Seismological Laboratory, California Institute of Technology
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MENG Lingsen
Seismological Laboratory, California Institute of Technology
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WU Wenbo
Department of Earth and Space Sciences, University of Science and Technology of China
関連論文
- Migration process of very low-frequency events based on a chain-reaction model and its application to the detection of preseismic slip for megathrust earthquakes
- Mitigating artifacts in back-projection source imaging with implications for frequency-dependent properties of the Tohoku-Oki earthquake