Investigation of Strain and Thin Film Relaxation in Ge_xSi_<1-x>/Si Strained-Layer Superlattice by Dark-Field Electron Holography
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概要
- 論文の詳細を見る
- 2012-11-01
著者
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Duan Xiaofeng
Beijing National Laboratory For Condensed Matter Physics Chinese Academy Of Science
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Gu Lin
Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Science, Beijing, P. R. China
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GU Lin
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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WANG Zhifeng
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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YAO Yuan
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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HE Xiaoqing
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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YANG Yang
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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WANG Yanguo
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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DUAN Xiaofeng
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
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- Investigation of Strain and Thin Film Relaxation in Ge_xSi_/Si Strained-Layer Superlattice by Dark-Field Electron Holography