Numerical Analysis of the Effect of Thin-Film Thickness and Material in Field Mapping of Eddy-Current Probes Using Photoinductive Technique

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概要

• 論文の詳細を見る
• 2012-01-01

著者

• Pan Yen-lin

  National Cheng Kung University

• Liang Dong-shong

  Kun Shan University

• TAI Cheng-Chi

  National Cheng Kung University

関連論文

• Numerical Analysis of the Effect of Thin-Film Thickness and Material in Field Mapping of Eddy-Current Probes Using Photoinductive Technique

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